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1

Characterization of pulsed discharge plasma at atmospheric pressure

Lekha Nath Mishra, Kanetoshi Shibata, Hiroaki Ito, Noboru Yugami, Yasushi Nishida

Journal:

Surface and Coatings Technology

Année:

2007

Langue:

english

Fichier:

PDF, 356 KB

english, 2007

2

[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Experimental analysis of gate oxide degradation-existence of neutral trap precursor, single and multiple trap-assisted-tunneling for SILC mechanism

Yamada, R., Yugami, J., Ohkura, M.

Année:

2000

Langue:

english

Fichier:

PDF, 586 KB

english, 2000

3

[ASME ASME 2014 8th International Conference on Energy Sustainability collocated with the ASME 2014 12th International Conference on Fuel Cell Science, Engineering and Technology - Boston, Massachusetts, USA (Monday 30 June 2014)] Volume 1: Combined Energy Cycles, CHP, CCHP, and Smart Grids; Concentrating Solar Power, Solar Thermochemistry and Thermal Energy Storage; Geothermal, Ocean, and Emerging Energy Technologies; Hydrogen Energy Technologies; Low/Zero Emission Power Plants and Carbon Sequestration; Photovoltaics; Wind Energy Systems and Technologies - Application of Transparent Conductive Oxides Films for High-Temperature Solar Selective Absorbers

Shimizu, Makoto, Suzuki, Mari, Kohiyama, Asaka, Iguchi, Fumitada, Yugami, Hiroo

Année:

2014

Langue:

english

Fichier:

PDF, 1.16 MB

english, 2014

4

Accurate description of Gaussian laser beams and electron dynamics

N. Cao, Y.K. Ho, Q. Kong, P.X. Wang, X.Q. Yuan, Yasushi Nishida, Noboru Yugami, H. Ito

Journal:

Optics Communications

Année:

2002

Langue:

english

Fichier:

PDF, 599 KB

english, 2002

5

Positive charge generation due to species of hydrogen during NBTI phenomenon in pMOSFETs with ultra-thin SiON gate dielectrics

Shimpei Tsujikawa, Jiro Yugami

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 323 KB

english, 2005

6

Current reliability issues and future technologies for systems on silicon – processes, circuits, chip architecture, and design

Eiji Takeda, Takao Watanabe, Shinichiro Kimura, Jiro Yugami, Keiichi Haraguchi, Kei Suzuki, Katsuro Sasaki

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 1.85 MB

english, 2000

7

[IEEE 2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) - Tokyo, Japan (2014.7.15-2014.7.16)] 2014 4th IEEE International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) - Large-scale Ge-on-Insulator wafers using low-temperature bonding and Epitaxial Lift-Off (ELO) technique

Mieda, E., Maeda, T., Yasuda, T., Maeda, A., Kurashima, Y., Takagi, H., Aoki, T., Yamamoto, T., Ichikawa, O., Osada, T., Hata, M., Ashihara, H., Waseda, T., Yugami, J., Kikuchi, T., Kunii, Y.

Année:

2014

Langue:

english

Fichier:

PDF, 243 KB

english, 2014

8

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Vth-tunable CMIS platform with high-k gate dielectrics and variability effect for 45nm node

Hayashi,, Mizutani, M., Inoue, M., Yugami, J., Tsuchimoto, J., Anma, M., Komori, S., Tsukamoto, K., Tsukamoto, Y., Nii, K., Nishida, Y., Sayama, H., Yamashita, T., Oda, H., Eimori, T., Ohji, Y.

Année:

2005

Langue:

english

Fichier:

PDF, 857 KB

english, 2005

9

[IEEE Technology (ICICDT) - Grenoble, France (2010.06.2-2010.06.4)] 2010 IEEE International Conference on Integrated Circuit Design and Technology - Pre-existing and process induced defects in high-k gate dielectrics ∼direct observation with EBIC and impact on 1/f noise∼

Sato, Motoyuki, Chen, Jun, Sekiguchi, Takashi, Chikyow, Toyohiro, Yugami, Jiro, Ikeda, Kazuto, Ohji, Yuzuru

Année:

2010

Langue:

english

Fichier:

PDF, 502 KB

english, 2010

10

Mandibular positions and jaw-closing muscle activity during sleep

K. Yugami, S. Yamashita, M. Ai, J. Takahashi

Journal:

Journal of Oral Rehabilitation

Année:

2000

Langue:

english

Fichier:

PDF, 316 KB

english, 2000

11

Traveling wave amplifier using “VP×B” effect

X. Xu, N. Yugami, Y. Nishida, K. Oya

Journal:

Journal of Infrared, Millimeter and Terahertz Waves

Année:

1994

Langue:

english

Fichier:

PDF, 396 KB

english, 1994

12

Microstructures and grain boundary conductivity of BaZr1−xYxO3 (x = 0.05, 0.10, 0.15) ceramics

Fumitada Iguchi, Noriko Sata, Takao Tsurui, Hiroo Yugami

Journal:

Solid State Ionics

Année:

2007

Langue:

english

Fichier:

PDF, 628 KB

english, 2007

13

Catalytic activity of carbon-supported iridium oxide for oxygen reduction reaction as a Pt-free catalyst in polymer electrolyte fuel cell

C.H. Chang, T.S. Yuen, Y. Nagao, H. Yugami

Journal:

Solid State Ionics

Année:

2011

Langue:

english

Fichier:

PDF, 521 KB

english, 2011

14

Evidence for bulk trap generation during NBTI phenomenon in pMOSFETs with ultrathin SiON gate dielectrics

Tsujikawa, S., Yugami, J.

Journal:

IEEE Transactions on Electron Devices

Année:

2006

Langue:

english

Fichier:

PDF, 314 KB

english, 2006

15

EDTV with scan-line video processor

Yugami, M., Ohara, K., Takeda, A.

Journal:

IEEE Transactions on Consumer Electronics

Année:

1992

Langue:

english

Fichier:

PDF, 605 KB

english, 1992

16

Accurate evaluation of mobility in high gate-leakage-current MOSFETs by using a transmission-line model

Tonomura, O., Shimamoto, Y., Miki, H., Saito, S.-I., Torii, K., Hiratani, M., Yugami, J.

Journal:

IEEE Transactions on Electron Devices

Année:

2004

Langue:

english

Fichier:

PDF, 385 KB

english, 2004

17

SPIE Proceedings [SPIE SPIE Photonic Devices + Applications - San Diego, California (Sunday 21 August 2011)] Terahertz Emitters, Receivers, and Applications II - Tunable terahertz radiation from an ultrashort-laser-pulse-induced discharge in biased air

Suzuki, Fuminori, Anno-Kashiwazaki, Hiroaki, Miyazawa, Jun, Ono, Shohei, Higashiguchi, Takeshi, Yugami, Noboru, Sentoku, Yasuhiko, Kodama, Ryosuke, Muggli, Patric, Razeghi, Manijeh, Péré-Laperne, Nico

Année:

2011

Langue:

english

Fichier:

PDF, 1.39 MB

english, 2011

18

[IEEE IECEC-97 Thirty-Second Intersociety Energy Conversion Engineering Conference (Cat. No.97CH6203) - Honolulu, HI, USA (27 July-1 Aug. 1997)] IECEC-97 Proceedings of the Thirty-Second Intersociety Energy Conversion Engineering Conference (Cat. No.97CH6203) - Highly concentrated solar energy transmission through an optical fiber coupled with CPC

Arashi, H., Naito, H., Yugami, H., Oka, T.

Année:

1997

Langue:

english

Fichier:

PDF, 613 KB

english, 1997

19

Experimental Observation of Radiation from Cherenkov Wakes in a Magnetized Plasma

Yugami, N., Higashiguchi, T., Gao, H., Sakai, S., Takahashi, K., Ito, H., Nishida, Y., Katsouleas, T.

Journal:

Physical Review Letters

Année:

2002

Langue:

english

Fichier:

PDF, 101 KB

english, 2002

20

[IEEE International Conference on Particle Accelerators - Washington, DC, USA (17-20 May 1993)] Proceedings of International Conference on Particle Accelerators - Laser Wakefield Accelerator experiments using 1 ps 30 TW Nd:glass laser

Nakajima, K., Nakanishi, H., Kawakubo, T., Ogata, A., Kitagawa, Y., Shiraga, H., Kodama, R., Zhang, T., Suzuki, K., Kato, Y., Sakawa, Y., Shoji, T., Nishida, Y., Yugami, N., Tajima, T.

Année:

1993

Langue:

english

Fichier:

PDF, 286 KB

english, 1993

21

in β″-alumina at 110 K

Yugami, H., Yagi, R., Matsuo, S., Ishigame, M.

Journal:

Physical Review B

Année:

1996

Langue:

english

Fichier:

PDF, 81 KB

english, 1996

22

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - V/sub ox/E/sub ox/-driven breakdown of ultra-thin SiON gate dielectric in p+gate-pMOSFET under low stress voltage of inversion mode

Tsujikawa, S., Shiga, K., Umeda, H., Akamatsu, Y., Yugami, J., Ohno, Y., Yoneda, M.

Année:

2005

Langue:

english

Fichier:

PDF, 966 KB

english, 2005

23

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Negative bias temperature instability of pMOSFETs with ultra-thin SiON gate dielectrics

Tsujikawa, S., Mine, T., Watanabe, K., Shimamoto, Y., Tsuchiya, R., Ohnishi, K., Onai, T., Yugami, J., Kimura, S.

Année:

2003

Langue:

english

Fichier:

PDF, 369 KB

english, 2003

24

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Fluorine incorporation into HfSiON dielectric for V/sub th/ control and its impact on reliability for poly-Si gate pFET

Inoue, M., Tsujikawa, S., Mizutani, M., Nomura, K., Hayashi, T., Shiga, K., Yugami, J., Tsuchimoto, J., Ohno, Y., Yoneda, M.

Année:

2005

Langue:

english

Fichier:

PDF, 488 KB

english, 2005

25

Fabrication of proton-exchanged SrMO 3 (M = Zr AND Ce) thtn films and SrCeO 3 /SrZrO 3 superlattices by laser ablation

Yugami, H., Naito, H., Arashi, H.

Journal:

Integrated Ferroelectrics

Année:

1998

Langue:

english

Fichier:

PDF, 96 KB

english, 1998

26

O-

Matsuo, S., Yugami, H., Ishigame, M.

Journal:

Physical Review B

Année:

1993

Langue:

english

Fichier:

PDF, 312 KB

english, 1993

27

[IEEE 2006 14th International Conference on Advanced Thermal Processing of Semiconductors - Kyoto (2006.10.10-2006.10.13)] 2006 14th IEEE International Conference on Advanced Thermal Processing of Semiconductors - The Progress in Ultra Thin Gate Dielecgtric for System LSI Application

Yugami, J., Tsujikawa, S., Inoue, M., Mizutani, M., Hayashi, T., Nishida, Y., Umeda, H.

Année:

2006

Langue:

english

Fichier:

PDF, 1.75 MB

english, 2006

28

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - True influence of wafer-backside copper contamination during the back-end process on device characteristics

Hozawa, K., Miyazaki, H., Yugami, J.

Année:

2002

Langue:

english

Fichier:

PDF, 249 KB

english, 2002

29

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - A simple approach to optimizing ultra-thin SiON gate dielectrics independently for n- and p-MOSFETs

Tsujikawa, S., Umeda, H., Kawahara, T., Kawasaki, Y., Shiga, K., Yamashita, T., Hayashi, T., Yugami, J., Ohno, Y., Yoneda, M.

Année:

2005

Langue:

english

Fichier:

PDF, 276 KB

english, 2005

30

Spectrally Controlled Thermal Radiation Based on Surface Microstructures for High-efficiency Solar Thermophotovoltaic System

Kohiyama, Asaka, Shimizu, Makoto, Kobayashi, Hiroaki, Iguchi, Fumitada, Yugami, Hiroo

Journal:

Energy Procedia

Année:

2014

Langue:

english

Fichier:

PDF, 428 KB

english, 2014

31

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 21 August 2011)] Advances in X-Ray/EUV Optics and Components VI - Scaling of laser produced plasma UTA emission down to 3 nm for next generation lithography and short wavelength imaging

Li, Bowen, Endo, Akira, Otsuka, Takamitsu, O'Gorman, Colm, Cummins, Thomas, Donnelly, Tony, Kilbane, Deirdre, Jiang, Weihua, Higashiguchi, Takeshi, Yugami, Noboru, Dunne, Padraig, O'Sullivan, Gerry, M

Année:

2011

Langue:

english

Fichier:

PDF, 835 KB

english, 2011

32

High-efficiency solar-thermophotovoltaic system equipped with a monolithic planar selective absorber/emitter

Shimizu, Makoto, Kohiyama, Asaka, Yugami, Hiroo

Journal:

Journal of Photonics for Energy

Année:

2015

Langue:

english

Fichier:

PDF, 1.41 MB

english, 2015

33

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Extreme Ultraviolet (EUV) Lithography III - Laser-produced plasma UTA emission in 3-7nm spectral region

Higashiguchi, Takeshi, Otsuka, Takamitsu, Yugami, Noboru, Jiang, Weihua, Endo, Akira, Li, Bowen, O'Gorman, Colm, Cummins, Thomas, Kilbane, Deirdre, Dunne, Padraig, O'Sullivan, Gerard, Naulleau, Patric

Année:

2012

Langue:

english

Fichier:

PDF, 1.36 MB

english, 2012

34

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 21 August 2011)] Advances in X-Ray/EUV Optics and Components VI - Shorter wavelength EUV source around 6.X nm by rare-earth plasma

Otsuka, Takamitsu, Kilbane, Deirdre, Cummins, Thomas, O'Gorman, Colm, Dunne, Padraig, O'Sullivan, Gerry, Jiang, Weihua, Endo, Akira, Higashiguchi, Takeshi, Yugami, Noboru, Morawe, Christian, Khounsary

Année:

2011

Langue:

english

Fichier:

PDF, 570 KB

english, 2011

35

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Extreme Ultraviolet (EUV) Lithography III - A 6.7-nm beyond EUV source as a future lithography source

Otsuka, Takamitsu, Li, Bowen, O'Gorman, Colm, Cummins, Thomas, Kilbane, Deirdre, Higashiguchi, Takeshi, Yugami, Noboru, Jiang, Weihua, Endo, Akira, Dunne, Padraig, O'Sullivan, Gerard, Naulleau, Patric

Année:

2012

Langue:

english

Fichier:

PDF, 418 KB

english, 2012

36

Electronic structure of La[sub 1−x]Sr[sub x]ScO[sub 3] probed by soft-x-ray absorption spectroscopy

T. Higuchi, Y. Nagao, J. Liu, F. Iguchi, N. Sata, T. Hattori, H. Yugami

Année:

2008

Langue:

english

Fichier:

PDF, 420 KB

english, 2008

37

Copper Diffusion Behavior in SiO 2 /Si Structure During 400°C Annealing

Hozawa, Kazuyuki, Yugami, Jiro

Journal:

Japanese Journal of Applied Physics

Année:

2004

Langue:

english

Fichier:

PDF, 527 KB

english, 2004

38

V ox / E ox -Driven Breakdown of Ultrathin SiON Gate Dielectrics in p-Type Metal Oxide Semiconductor Field Effect Transistors under Low-Voltage Inversion Stress

Tsujikawa, Shimpei, Shiga, Katsuya, Umeda, Hiroshi, Yugami, Jiro

Journal:

Japanese Journal of Applied Physics

Année:

2007

Langue:

english

Fichier:

PDF, 270 KB

english, 2007

39

Thermal Management Technique Using Control of Thermal Radiation Spectrum for Encapsulated Electronic Devices

Tsuda, Shinichiro, Shimizu, Makoto, Iguchi, Fumitada, Yugami, Hiroo

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology

Année:

2015

Langue:

english

Fichier:

PDF, 1.36 MB

english, 2015

40

Thallium Contamination in Wild Ducks in Japan

Mochizuki, Mariko, Mori, Makoto, Akinaga, Mayumi, Yugami, Kyoko, Oya, Chika, Hondo, Ryo, Ueda, Fukiko

Journal:

Journal of Wildlife Diseases

Année:

2005

Langue:

english

Fichier:

PDF, 94 KB

english, 2005

41

A Single-shot Terahertz Time-domain Spectroscopy Instrument for Intense Laser System

Jin, Z, Wada, A, Shin, J H, Yugami, N, Kodama, R

Journal:

Journal of Physics Conference Series

Année:

2016

Langue:

english

Fichier:

PDF, 5.53 MB

english, 2016

42

TET2-dependent IL-6 induction mediated by the tumor microenvironment promotes tumor metastasis in osteosarcoma

Itoh, Hitoshi, Kadomatsu, Tsuyoshi, Tanoue, Hironori, Yugami, Masaki, Miyata, Keishi, Endo, Motoyoshi, Morinaga, Jun, Kobayashi, Eisuke, Miyamoto, Takeshi, Kurahashi, Ryoma, Terada, Kazutoyo, Mizuta,

Journal:

Année:

2018

Langue:

english

Fichier:

PDF, 3.41 MB

english, 2018

43

Evaluation of thermal stability in spectrally selective few-layer metallo-dielectric structures for solar thermophotovoltaics

Shimizu, Makoto, Kohiyama, Asaka, Yugami, Hiroo

Journal:

Journal of Quantitative Spectroscopy and Radiative Transfer

Année:

2018

Langue:

english

Fichier:

PDF, 670 KB

english, 2018

44

Amorphous Nanohole Patterns Formed by Spinodal Decomposition of Nickel Superalloys for Solar-Selective Absorbers

Shimizu, Makoto, Liu, Zhen, Yugami, Hiroo

Journal:

ACS Applied Nano Materials

Année:

2020

Fichier:

PDF, 3.08 MB

2020

45

Erythroleukemia in a child associated with monosomy 7

Toshiji Shitara, Shin-Ichiroh Yugami, Manabu Sotomatu, Yukio Oshima, Hiroko Ijima, Takayoshi Kuroume

Journal:

Année:

1991

Langue:

english

Fichier:

PDF, 266 KB

english, 1991

46

Recombinant human stem cell factor, a c-kit ligand, stimulates granulopoiesis in severe congenital neutropenia

Hiroko Ijima, Toshiji Shitara, Shin-Ichiroh Yugami, Manabu Sotomatu, Takayoshi Kuroume

Journal:

American Journal of Hematology

Année:

1993

Langue:

english

Fichier:

PDF, 108 KB

english, 1993

47

Dipyridamole enhancement of drug sensitivity in acute lymphoblastic leukemia cells

Dr. Manabu Sotomatsu, Shin-Ichirou Yugami, Toshiji Shitara, Takayoshi Kuroume

Journal:

American Journal of Hematology

Année:

1993

Langue:

english

Fichier:

PDF, 410 KB

english, 1993

48

Cytokine profile during high-dose rhG-CSF therapy in severe congenital neutropenia

Dr. Toshiji Shitara, Shin-Ichiroh Yugami, Hiroko Ijima, Manabu Sotomatu, Takayoshi Kuroume

Journal:

American Journal of Hematology

Année:

1994

Langue:

english

Fichier:

PDF, 399 KB

english, 1994

49

Oxide reliability improvement controlling microstructures of substrate/oxide and oxide/gate interfaces

Journal:

Superlattices and Microstructures

Année:

2000

Langue:

english

Fichier:

PDF, 359 KB

english, 2000

50

Temperature dependence of homogeneous line width of Eu3+ in β″-alumina studied by fluorescence line narrowing spectroscopy

H. Yugami, T. Watanabe, H. Arashi, T. Hattori, M. Ishigame

Journal:

Journal of Luminescence

Année:

1993

Langue:

english

Fichier:

PDF, 888 KB

english, 1993